Simple Services References

•  Brennan S. and Cowan P.L., A suite of programs for calculating x-ray absorption, reflection, and diffraction performance for a variety of materials at arbitrary wavelengths, Rev.Sci.Instr. 63 , 850-853 (1992).
•  Stevenson A., X-ray integrated intensities from semiconductor substrates and epitaxic layers - a comparison of kinematical and dynamical theories with experiment, Acta.Cryst. A 49 , 174-183 (1993).
•  Stepanov S.,  X0h on the Web . 
•  NIST: X-ray Form Factor, Attenuation and Scattering Tables
•  Zschornack G,  Handbook of X-ray Data (Springer, Berlin,2007).
•  ICRU Report 44 (1989).
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